| 标题 |
Beyond 10 μm Depth Ultra-High Speed Etch Process with 84% Lower Carbon Footprint for Memory Channel Hole of 3D NAND Flash over 400 Layers |
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期刊:2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) 作者:Yoshihide Kihara; Maju Tomura; Wataru Sakamoto; Masanobu Honda; Masayuki Kojima 出版日期:2023 |
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(2025-6-4)