| 标题 |
[高分]
Analysis of Random Telegraph Noise Characteristics with Two Different Cell States in 3-D NAND Flash Memory |
| 网址 | |
| DOI | |
| 其它 |
期刊:JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 作者:Nagyong Choi; Ho-Jung Kang; Jong-Ho Lee 出版日期:2019 |
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