铁电性
正交晶系
薄膜
材料科学
凝聚态物理
扫描透射电子显微镜
透射电子显微镜
衍射
极化(电化学)
格子(音乐)
晶体结构
结晶学
光学
光电子学
纳米技术
化学
电介质
物理
物理化学
声学
作者
Xiahan Sang,Everett D. Grimley,Tony Schenk,Uwe Schroeder,James M. LeBeau
摘要
Here, we present a structural study on the origin of ferroelectricity in Gd doped HfO2 thin films. We apply aberration corrected high-angle annular dark-field scanning transmission electron microscopy to directly determine the underlying lattice type using projected atom positions and measured lattice parameters. Furthermore, we apply nanoscale electron diffraction methods to visualize the crystal symmetry elements. Combined, the experimental results provide unambiguous evidence for the existence of a non-centrosymmetric orthorhombic phase that can support spontaneous polarization, resolving the origin of ferroelectricity in HfO2 thin films.
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