仪表(计算机编程)
工作流程
表征(材料科学)
原子探针
钥匙(锁)
纳米技术
计算机科学
材料科学
系统工程
工程类
计算机安全
数据库
透射电子显微镜
操作系统
作者
Zhiqiang Zhou,Zhengquan Wang,Ranming Niu,Pang-Yu Liu,Chao Huang,Yi-Hsuan Sun,Xiutong Wang,Hsu-Chun Yen,Julie M. Cairney,Y. Chen
出处
期刊:Microstructures
[OAE Publishing Inc.]
日期:2023-11-06
卷期号:3 (4)
标识
DOI:10.20517/microstructures.2023.38
摘要
Cryogenic atom probe tomography (cryo-APT) is a new microstructure characterization technique with the potential to address challenges across various research fields. In this review, we provide an overview of the development of cryo-APT and the associated instrumentation that transforms conventional APT into cryo-APT. We start by introducing the APT principle and the instrumentation involved in the cryo-APT workflow, emphasizing the key techniques that enable cryo-APT specimen preparation. Furthermore, we shed light on the research made possible by cryo-APT, presenting several recent outcomes to demonstrate its capabilities effectively. Finally, we discuss the limitations of cryo-APT and summarize the potential research areas that can further benefit from this cutting-edge microstructural characterization technique.
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