小型化
微电子机械系统
天文干涉仪
法布里-珀罗干涉仪
分光计
干涉测量
自由光谱范围
材料科学
光学滤波器
滤波器(信号处理)
光学
光电子学
计算机科学
波长
纳米技术
物理
计算机视觉
作者
Jarkko Antila,Rami Mannila,Uula Kantojärvi,Christer Holmlund,Anna Rissanen,Ismo Näkki,Jyrki Ollila,Heikki Saari
摘要
The trend in the development of single-point spectrometric sensors is miniaturization, cost reduction and increase of functionality and versatility. MEMS Fabry-Perot interferometers (FPI) have been proven to meet many of these requirements in the form of miniaturized spectrometer modules and tuneable light sources. Recent development of MEMS FPI devices based on ALD thin film structures potentially addresses all of these main trends. In this paper we present a device and first measurement results of a small imaging spectrometer utilizing a 1.5 mm tuneable MEMS FPI filter working in the visible range of 430-580 nm. The construction of the instrument and the properties of the tuneable filter are explained especially from imaging requirements point of view.
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