纳米化学
材料科学
拉曼光谱
碲
剥脱关节
Atom(片上系统)
纳米线
制作
纳米尺度
纳米技术
原子力显微镜
单晶
结晶学
石墨烯
光学
化学
医学
物理
替代医学
病理
计算机科学
冶金
嵌入式系统
作者
Hugh Churchill,Gregory J. Salamo,Shui-Qing Yu,Takayuki Hironaka,Xian Guo Hu,J.T. Stacy,I. Shih
标识
DOI:10.1186/s11671-017-2255-x
摘要
We demonstrate that the atom chain structure of Te allows it to be exfoliated as ultra-thin flakes and nanowires. Atomic force microscopy of exfoliated Te shows that thicknesses of 1–2 nm and widths below 100 nm can be exfoliated with this method. The Raman modes of exfoliated Te match those of bulk Te, with a slight shift (4 cm−1) due to a hardening of the A1 and E modes. Polarized Raman spectroscopy is used to determine the crystal orientation of exfoliated Te flakes. These experiments establish exfoliation as a route to achieve nanoscale trigonal Te while also demonstrating the potential for fabrication of single atom chains of Te.
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