胡须
原子力显微镜
络腮胡子
表征(材料科学)
材料科学
纳米压痕
弯曲
基质(水族馆)
模数
纳米技术
复合材料
导电原子力显微镜
云母
扫描力显微镜
海洋学
地质学
作者
Daniel Kluge,Frank Abraham,Stephan Schmidt,Hans‐Werner Schmidt,Andreas Fery
出处
期刊:Langmuir
[American Chemical Society]
日期:2010-02-03
卷期号:26 (5): 3020-3023
被引量:31
摘要
In this Letter, we investigate the nanomechanical properties of self-assembled 1,3,5-benzenetrisamide whiskers with atomic force microscopy (AFM) bending experiments. We use force mapping to acquire spatially resolved force measurements over the full length of a whisker segment spanning a channel of a structured glass substrate. This allows validation of the experimental boundary conditions directly from the AFM data and a reliable determination of Young's modulus. The presented technique can be generalized for the mechanical characterization of other one-dimensional materials.
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