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12 积分 2026-01-15 加入
Study on Single Event Burnout Effect for 18V LDMOS Based on 0.18µm Process Technology
2个月前
已完结
Research on single event effects and hardening design of LDMOS transistors
2个月前
已完结
Single event transient analysis of isolation problems for the high side devices in a 0.18μm BCD Process
2个月前
已完结
Investigation of Single-Event Burnout in Laterally-Diffused Metal-Oxide Semiconductor for Power Modulation Circuits
2个月前
已完结
Single-Event Burnout Effects of Complementary LDMOS Devices in High-Voltage Integrated Circuits
2个月前
已完结
A Source Segmented LDMOS Structure for Improving Single Event Burnout Tolerance Based on High-Voltage BCD Process
2个月前
已完结
Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses
3个月前
已完结
DC response, low-frequency noise, and TID-induced mechanisms in 16-nm FinFETs for high-energy physics experiments
3个月前
已完结
A Modified Zener Diode-Triggered Silicon Controlled Rectifier Used for 5V Application in 0.18um BCD Process
4个月前
已完结
ELDRS in a Commercial 28-nm CMOS Technology
6个月前
已完结
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