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90 积分 2025-03-26 加入
Investigation on time-dependent behavior of resistivity in high-resistivity silicon wafers
13小时前
已完结
Probing superconducting granularity using nonlocal four-probe measurements
13小时前
已完结
New IEC standards for the measurement of sheet resistance on large-area graphene using the van der Pauw and the in-line four-point probe methods
13小时前
待确认
Measurement of nanoscale roughness using white-light interferometry
21天前
已完结
Nanometer-resolution white-light scanning interferometry for surface-profiling of hybrid bonding samples for advanced semiconductor packaging
21天前
已完结
Application of Confocal Microscopy Methods for Research and Non-destructive Examination of Semiconductor Structures and Integrated Circuits
21天前
已完结
Establishment of a Four Probe Method for Measuring Surface Resistance of Materials
22天前
已完结
Superior cycling performance of a sandwich structure Si/C anode for lithium ion batteries
1个月前
已完结
Utilizing Cold Rolling Mill Iron Oxide To Synthesize Lithium Iron Phosphate for Li-Ion Batteries
1个月前
已完结
Shallow Impurity States in Doped Silicon Substrates Enabling High Responsivity for Graphene Mid-Infrared Photodetectors
1个月前
已完结
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