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Development of a Thickness Meter for Conductive Thin Films Using Four-Point Probe Method
14小时前
待确认
Development of an Automatic Precision Sheet Resistance Measurement System Using the Four-Point Probe Method
14小时前
求助中
Transparent conductive properties of TiON thin films
15小时前
已完结
Temperature Characteristics of 4H-SiC Substrate and Thin-Film Resistor Applied in MEMS Piezoresistive Sensors
5天前
已完结
Achieving high sheet resistance and near-zero temperature coefficient of resistance in NiCr film resistors by Al interlayers
14天前
已完结
A General Method to Accurately Measure the Thin-Film Sheet Resistance for Sensors
14天前
已完结
Thin-film optical function acquisition from experimental measurements of the reflectance and transmittance spectra: a case study
17天前
已完结
Effect analysis of surface metal layer on step height standard
18天前
已完结
Investigating the Impact of Probe Geometry Characteristics on the Ra in the International Metrology Comparison of Surface Roughness
20天前
已完结
Non-Destructive Surface Roughness Analysis for Polymer-Based Products: Integrating Laser Speckle Contrast and Stylus Profilometry
20天前
已完结
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