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40 积分 2024-03-27 加入
Radiation effects and reliability characteristics of Ge pMOSFETs
11个月前
已完结
NBTI reliability on high-k metal-gate SiGe transistor and circuit performances
11个月前
已完结
Effect of Channel Length and Width on NBTI in Ultra Deep Sub-Micron PMOSFETs
11个月前
已完结
Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs
11个月前
已完结
NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors
11个月前
已完结
Superior NBTI in High-k SiGe Transistors–Part II: Theory
1年前
已完结
Interface Passivation Strategy for Ge pMOSFET From a TID Perspective
1年前
已完结
Bias-temperature instabilities and radiation effects in MOS devices
1年前
已完结
Total Ionizing Dose Effects in Si-Based Tunnel FETs
1年前
已完结
The influence of channel size on total dose irradiation and hot-carrier effects of sub-micro NMOSFET
1年前
已完结
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