Lv1
36 积分 2026-06-21 加入
Impact of bond rupture dynamics at polar and non-polar interfaces on time-dependent dielectric breakdown (TDDB) of GaN FinFETs
2天前
已完结
Origin of threshold voltage instability in vertical GaN trench MOSFETs characterized by charge pumping
2天前
已完结
Study of interface trap density of AlOxNy/GaN MOS structures
2天前
已完结
Study of interface trap density of AlOxNy/GaN MOS structures
12天前
已完结