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80 积分 2024-06-04 加入
Tip geometry effects in scanning capacitance microscopy on GaAs Schottky and metal-oxide-semiconductor-type junctions
1天前
待确认
TWO-DIMENSIONAL DOPANT PROFILING BY SCANNING CAPACITANCE MICROSCOPY
1天前
已完结
Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope
2天前
已完结
Silicon spikes and impurity accumulation at interrupted growth interfaces during molecular-beam epitaxy
1个月前
已完结
Research progress in terahertz quantum-cascade lasers and quantum-well photodetectors
7个月前
已完结
Scanning Capacitance Microscopy of Dopants in III-V Semiconductors
9个月前
已关闭
Analysis of effects of interface-state charges on the electrical characteristics in GaAs/GaN heterojunctions
10个月前
已完结
Scanning capacitance microscope methodology for quantitative analysis of p-n junctions
11个月前
已完结
Thermal equilibrium concentrations of the amphoteric dopant Si and the associated carrier concentrations in GaAs
11个月前
已完结
Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy
11个月前
已完结
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