Lv11
80 积分 2024-06-04 加入
Doping in III-V Semiconductors
2小时前
待确认
Tip geometry effects in scanning capacitance microscopy on GaAs Schottky and metal-oxide-semiconductor-type junctions
1个月前
已完结
TWO-DIMENSIONAL DOPANT PROFILING BY SCANNING CAPACITANCE MICROSCOPY
1个月前
已完结
Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope
1个月前
已完结
Silicon spikes and impurity accumulation at interrupted growth interfaces during molecular-beam epitaxy
2个月前
已完结
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