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80 积分 2024-06-04 加入
Kelvin probe force microscopy under ambient conditions
5天前
已完结
Monolithically Integrated Dual-Band Quantum Well Infrared Photodetector
1个月前
已完结
Doping in III-V Semiconductors
2个月前
已完结
Tip geometry effects in scanning capacitance microscopy on GaAs Schottky and metal-oxide-semiconductor-type junctions
3个月前
已完结
TWO-DIMENSIONAL DOPANT PROFILING BY SCANNING CAPACITANCE MICROSCOPY
3个月前
已完结
Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope
3个月前
已完结
Silicon spikes and impurity accumulation at interrupted growth interfaces during molecular-beam epitaxy
4个月前
已完结
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