Lv6
1886 积分 2024-08-08 加入
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X-ray photoelectron spectroscopy of thin films
1个月前
已完结
Emergent phenomena at oxide interfaces
1个月前
已完结
X-ray photoelectron spectroscopy of thin films
1个月前
已完结
X-ray diffraction (XRD) techniques for materials characterization
5个月前
已完结
Superconductivity in infinite-layer and Ruddlesden–Popper nickelates
5个月前
已完结
Thin film metrology techniques: x-ray diffraction and x-ray reflectivity
7个月前
已完结
Superconductivity and normal-state transport in compressively strained La2PrNi2O7 thin films
7个月前
已完结
Tuning electrochemically driven surface transformation in atomically flat LaNiO3 thin films for enhanced water electrolysis
9个月前
已完结
Characterization of Ni2O3⋅6H2O by XPS
10个月前
已完结
Characterization of NiO by XPS
10个月前
已完结