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5 积分 2021-12-07 加入
Unraveling the Defect Physics of SiC Micropipe Sidewalls by Non-Line-of-Sight Confocal Spectromicroscopy: Amphoteric Giant Traps
7小时前
待确认
Development and characterization of high-quality 150 mm p-type 4H-SiC substrates using solution growth
1个月前
已完结
Influence of 4H-SiC Epitaxial Morphological Defects on the Electrical Characteristics of MOSFET
1个月前
已完结
Induction frequency modulation for 4H-SiC growth: Thermal field evolution, dislocation suppression, and high-quality crystal preparation via PVT method
1个月前
已完结
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