Lv5
1500 积分 2025-05-14 加入
Measurements of Electrical and Thermal Conductivity of Hydrogen, Nitrogen, and Argon at High Temperatures
7天前
已完结
Dislocation density assessment via X‐ray GaN rocking curve scans
16天前
已完结
The Diffusivity and Solubility of Oxygen in Silicon
26天前
已完结
Oxygen solubility and its temperature dependence in a silicon melt in equilibrium with solid silica
27天前
已关闭
Study about FZ/MCZ Si Wafer (Mother) Material Carbon and Oxygen density for RC-IGBT with Electron Beam Irradiation Based on Electrical and Physical Analysis
1个月前
已完结
Substrate defects affecting gate oxide integrity
1个月前
已完结
Constitutional Supercooling in Czochralski Growth οf Heavily Doped Silicon Crystals
2个月前
已完结
Defect Formation Behaviors in Heavily Doped Czochralski Silicon
2个月前
已完结
Characteristic Study of Silicon Nitride Films Deposited by LPCVD and PECVD
2个月前
已完结
Avalanche breakdown characteristics of a diffused P-N junction
2个月前
已完结