Lv41
730 积分 2025-05-14 加入
Loss of coherency of growing particles by the prismatic punching of dislocation loops
2小时前
待确认
Surface- and inner-microdefects in annealed silicon wafer containing oxygen
5小时前
已完结
Transition from a punched-out dislocation to a slip dislocation revealed by electron tomography
27天前
已完结
150–200 V Split-Gate Trench Power MOSFETs with Multiple Epitaxial Layers
1个月前
已完结
Gold and platinum diffusion: The key to the understanding of intrinsic point defect behavior in silicon
2个月前
已完结
Characterization of mirror-like wafer surfaces using the magic mirror method
2个月前
已完结
Detection of surface defects of Si epitaxial wafers by the magic-mirror approach
2个月前
已完结
Stress in undoped LPCVD polycrystalline silicon
3个月前
已完结
Analysis of Influencing Factors on Silicon Epitaxial Growth in Horizontal Single‐Wafer Reactor through Orthogonal Test
3个月前
已完结
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