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478 积分 2026-01-08 加入
STUDY OF DEFECTS IN LOW-DOSE P+ IMPLANTED AND RAPID THERMAL ANNEALED SILICON
1小时前
求助中
Degradation of solution based metal induced laterally crystallized p-type poly-Si TFTS under DC bias stresses
21天前
已完结
Study of the Vth shift of the thin-film transistor by the bias temperature stress test
21天前
已完结
Effects of hot-carrier stress on high performance polycrystalline silicon thin film transistor with a single perpendicular grain boundary
21天前
已完结
Hot-carrier degradation for 90 nm gate length LDD-NMOSFET with ultra-thin gate oxide under low gate voltage stress
21天前
已完结
Hot-carrier degradation for 90 nm gate length LDD-NMOSFET with ultra-thin gate oxide under low gate voltage stress
21天前
已完结
Analysis of Defects in Polycrystalline Silicon Thin Films Using Raman Scattering Spectroscopy
2个月前
已完结
Unraveling Sub‐Nanostructure Variability in Amorphous Silicon: Mechanisms of Short‐Range Order and Defect Dynamics via In Situ Raman Spectroscopy
2个月前
已完结
Effects of Grain Size on Various Electrical Trap Extraction Methods in Low-Temperature Polysilicon Thin Films
2个月前
已完结
Dangling bonds, the charge neutrality level, and band alignment in semiconductors
2个月前
已完结
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