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20 积分 2026-02-06 加入
RRAM Endurance and Retention: Challenges, Opportunities and Implications on Reliable Design
1小时前
求助中
RRAM Endurance and Retention: Challenges, Opportunities and Implications on Reliable Design
1小时前
待确认
A 28nm 4Mb Embedded RRAM IP with Record-High Endurance of 107 Cycles and 10 Years@125°C Retention through Reliability-Enhanced Design-Technology Co-Optimization
6小时前
已完结
A RRAM that endures
6小时前
已完结
Investigation of Termination Soft Breakdown Mechanisms in 1700V-SiC MOSFETs Under HTRB with Different Temperatures
25天前
已完结
VLSI Technology
2个月前
已完结
Case Study of High-Temperature Induced Slip Defect Causing Overlay Issue
3个月前
已完结
The Study of Slip Defects in Furnace High Temperature Process
3个月前
已完结
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