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30 积分 2025-06-10 加入
Positive and negative threshold voltage instabilities in GaN-based transistors
5小时前
已完结
Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate
1个月前
已完结
Effects of sidewall MOS channel on performance of AlGaN/GaN FinFET
1个月前
已完结