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179 积分 2024-01-28 加入
A reliability study of DRAM capacitors in chip for beyond 10 nm scaling
6小时前
求助中
Vertical scale-down of Cu/low-k interconnect development for BEOL reliability improvement of 12nm DRAM
7小时前
已完结
Oxide and 2D TMD semiconductors for 3D DRAM cell transistors
7天前
已完结
3D X-DRAM: A Novel 3D NAND-like DRAM Cell and TCAD Simulations
7天前
已完结
Semiconductor Memory Technologies: State-of-the-Art and Future Trends
9天前
已完结
Assessing the Reliability of DRAM CMOS Periphery: Comparing AC and DC Conditions for BTI and TDDB
13天前
已完结
Improving DRAM Reliability Using a High Order Error Correction Code
13天前
已完结
Study of Metal–Dielectric Interface for Improving Electrical Properties and Reliability of DRAM Capacitor
13天前
已完结
Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC
13天前
已完结
A reliability study of DRAM capacitors in chip for beyond 10 nm scaling
13天前
已关闭
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