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1326 积分 2022-11-09 加入
Overview of Silicon Carbide Wafer Defect Types and Inspection Techniques
1个月前
已完结
Silicon photonics for the visible and near infrared spectrum
3个月前
已完结
Emerging integrated laser technologies in the visible and short near-infrared regimes
3个月前
已完结
Rationalized deep learning super-resolution microscopy for sustained live imaging of rapid subcellular processes
4个月前
已完结
Polarization-sensitive imaging with simultaneous bright- and dark-field optical coherence tomography
5个月前
已完结
Theoretical algorithm and application of a double-integrating sphere system for measuring leaf transmittance and reflectance spectra
6个月前
已完结
Revelation and analysis of optical phase delay exhibited by Al-doped 4H-SiC due to current induction
6个月前
已完结
Laser-driven broadband near-infrared light source with watt-level output
6个月前
已完结
Principles and Techniques of Schlieren Imaging Systems
7个月前
已完结
Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers
7个月前
已完结
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