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1930 积分 2025-11-01 加入
High Current Events Triggered by Heavy Ion Microbeam and Pulsed Laser on a MRAM
7天前
已完结
SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device
1个月前
已完结
Total Dose and Single Event Effects on 16 Mbit Standalone Spin-Transfer Torque MRAM with 45 nm CMOS Technology
1个月前
已完结
Single Event Effect on SiC MOSFETs With Junction Barrier Schottky Diode Structures
6个月前
已完结
Investigations of the MGy dose level radiation effects on the photometric budget of a radiation-hardened CMOS-based camera
7个月前
已关闭
Single-Event Burnout of SiC Junction Barrier Schottky Diode High-Voltage Power Devices
8个月前
已完结
Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes
8个月前
已完结
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