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1640 积分 2025-11-01 加入
SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device
4天前
已完结
Total Dose and Single Event Effects on 16 Mbit Standalone Spin-Transfer Torque MRAM with 45 nm CMOS Technology
4天前
已完结
Single Event Effect on SiC MOSFETs With Junction Barrier Schottky Diode Structures
5个月前
已完结
Investigations of the MGy dose level radiation effects on the photometric budget of a radiation-hardened CMOS-based camera
6个月前
已关闭
Single-Event Burnout of SiC Junction Barrier Schottky Diode High-Voltage Power Devices
6个月前
已完结
Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes
6个月前
已完结
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