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90 积分 2025-03-31 加入
Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry
1个月前
已完结
Nitrogen depth profiling in thin oxynitride layers on silicon
1个月前
已完结
Electron flood gun damage in the analysis of polymers and organics in time-of-flight SIMS
1个月前
已完结
Feasibility and Strategies for Direct Atomic Force Microscopy on Standard Transmission Electron Microscopy Specimens
3个月前
已完结
FIB Preparation of Mesa Structures for SIMS Analysis
7个月前
已关闭
Comparison of Xenon and Gallium sources on the detection and mapping of Lithium in Li‐containing materials by using ToF‐SIMS combined FIB‐SEM
7个月前
已完结
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM
7个月前
已关闭
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