Lv1
100 积分 2025-03-31 加入
Horizontal Distortion Correction of AFM Images Based on Automatic Labeling of Feature Graphics
2个月前
已完结
Electron flood gun damage in the analysis of polymers and organics in time-of-flight SIMS
2个月前
已完结
Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry
7个月前
已完结
Nitrogen depth profiling in thin oxynitride layers on silicon
7个月前
已完结
Electron flood gun damage in the analysis of polymers and organics in time-of-flight SIMS
7个月前
已完结
Feasibility and Strategies for Direct Atomic Force Microscopy on Standard Transmission Electron Microscopy Specimens
8个月前
已完结
FIB Preparation of Mesa Structures for SIMS Analysis
1年前
已关闭
Comparison of Xenon and Gallium sources on the detection and mapping of Lithium in Li‐containing materials by using ToF‐SIMS combined FIB‐SEM
1年前
已完结
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM
1年前
已关闭
皖公网安备34019202002308
