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Micromechanics of Defects in Nanostructured Materials
1天前
待确认
X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates
1天前
已完结
The Determination of Crystallite Size and Size Distribution from Broadened X-Ray Diffraction Lines
1天前
已完结
Growth and applications of Group III-nitrides
8天前
已完结
Spontaneous polarization and piezoelectric constants of III-V nitrides
8天前
已完结
Author index and subject index
15天前
已完结
Structural investigation of sapphire surface after nitridation
15天前
已完结
GaN Growth Using GaN Buffer Layer
15天前
已完结
Infrared reflection spectra of CdIn2O4 films
15天前
已完结
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