Lv22
164 积分 2024-03-28 加入
P‐7.14: Adjustment of etch performance and Vth by Mo thickness of Mo‐Al‐Mo gate electrode in ADS Pro TFT
1天前
待确认
Total ionizing dose effect in 0.2μm PDSOI NMOSFETs with shallow trench isolation
1个月前
已完结
Investigation of a Hump Phenomenon in Back-Channel-Etched Amorphous In-Ga-Zn-O Thin-Film Transistors Under Negative Bias Stress
1个月前
已完结
Investigation on stress induced hump phenomenon in IGZO thin film transistors under negative bias stress and illumination
1个月前
已完结
Abnormal double-hump phenomenon in amorphous In-Ga-Zn-O thin-film transistor under positive gate bias temperature stress
1个月前
已完结
Investigation of the anomalous hump phenomenon in amorphous InGaZnO thin-film transistors
1个月前
已完结
Positive gate bias stress-induced hump-effect in elevated-metal metal–oxide thin film transistors
1个月前
已完结
Investigation of an anomalous hump phenomenon in via-type amorphous In-Ga-Zn-O thin-film transistors under positive bias temperature stress
1个月前
已完结
Study of Positive-Gate-Bias-Induced Hump Phenomenon in Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors
1个月前
已完结
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