Lv21
124 积分 2024-03-28 加入
Investigation of a Hump Phenomenon in Back-Channel-Etched Amorphous In-Ga-Zn-O Thin-Film Transistors Under Negative Bias Stress
7小时前
已完结
Investigation on stress induced hump phenomenon in IGZO thin film transistors under negative bias stress and illumination
7小时前
已完结
Abnormal double-hump phenomenon in amorphous In-Ga-Zn-O thin-film transistor under positive gate bias temperature stress
7小时前
已完结
Investigation of the anomalous hump phenomenon in amorphous InGaZnO thin-film transistors
7小时前
已完结
Positive gate bias stress-induced hump-effect in elevated-metal metal–oxide thin film transistors
7小时前
已完结
Investigation of an anomalous hump phenomenon in via-type amorphous In-Ga-Zn-O thin-film transistors under positive bias temperature stress
7小时前
已完结
Study of Positive-Gate-Bias-Induced Hump Phenomenon in Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors
7小时前
已完结
P-10.10: The Analysis of Hump Phenomenon in DG Structured PMOS LTPS Thin-film Transistors under Positive Gate Bias
7小时前
已完结
P-1.37: The Impact of Polysilicon Low Power Etching Process on LTPS TFT Characteristics and Reliability
7小时前
已完结
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