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20 积分 2024-06-20 加入
Dependence of the Spill Back Effect on the Energy Level Distribution of Interface States Under the Transfer Gate in CMOS Image Sensor
2小时前
待确认
An Analytical Model of Dynamic Charge Transfer Process for CMOS Image Sensors
2小时前
已完结
Proton irradiation-induced dark current in 4T CMOS active pixel sensor: Experiment and modeling
4天前
已完结
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