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73 积分 2020-09-03 加入
Electron-beam-induced current (EBIC) imaging technique to quicken polysilicon defect localization in MOSFETs
5个月前
已完结
Combining Electron Beam Methods, EBIC and EBAC, with Traditional Approaches for Highly Effective Fault Isolation
5个月前
已关闭
Modeling of GaAs pHEMT parameters in Silvaco TCAD
5个月前
已关闭
Effect of Gate Sinking on the Device Performance of the InGaP/AlGaAs/InGaAs Enhancement-Mode PHEMT
9个月前
已完结
Enhanced surface passivation of GaAs nanostructures via an optimized SiO2 sol-gel shell growth
11个月前
已关闭
Revealing the mechanism of interfacial adhesion enhancement between the SiO2 film and the GaAs substrate via plasma pre-treatments
11个月前
已完结
STN-OCR: A single Neural Network for Text Detection and Text Recognition
11个月前
已完结
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