Lv6
2980 积分 2024-02-18 加入
High-Fluence Proton-Induced Degradation on AlGaN/GaN High-Electron-Mobility Transistors
1天前
已完结
Characterization of bulk traps and interface states in AlGaN/GaN heterostructure under proton irradiation
1天前
已完结
Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives
1天前
已完结
GaN HEMT reliability
1天前
已完结
Degradation in InAlN/GaN-based heterostructure field effect transistors: Role of hot phonons
1天前
已完结
Integrated Circuit Design of CMOS Deadtime Controller for 48 V GaN DC-DC Converter
9天前
已完结
TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications
26天前
已完结
Soft Error Tolerant Bandgap Reference Utilizing Single-Event Transient Filtering Technique
1个月前
已完结
A Low Overhead Single Event Transient Tolerant Bandgap Reference Based on Radiation-Hardened-By-Design (RHBD) Technique
1个月前
已完结
A TID-Hardened CMOS Bandgap Reference Circuit Design
1个月前
已完结
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