Lv11
30 积分 2026-06-24 加入
Failure Behavioral Process and Mechanism of SiC MOSFETs Under Dynamic Reverse Bias
1小时前
待确认
DV/dt-Induced degradation and failure mechanisms in 1200 V SiC MOSFETs under dynamic reverse bias stress
4小时前
已完结
Over dV/dt Robustness of Switching Behavior of SiC MOSFET and a Novel Main Junction Region Design
5小时前
已完结
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