Lv5
1250 积分 2022-10-24 加入
In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System
3天前
已完结
Applications of model-based transparent surface films analysis using coherence-scanning interferometry
8个月前
已完结
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
8个月前
已完结
Advances in optical metrology and instrumentation: introduction
8个月前
已关闭
Accurate, repetitive, linear motion from biased piezoelectric actuators
8个月前
已完结
用于表面形貌测量的扫描白光干涉技术进展
8个月前
已完结
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