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mostwangyu
Lv1
35 积分
2020-11-10 加入
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Extraction of the threshold voltage of MOSFETs: an overview
26天前
已完结
Proposal of New Interconnection Technique for Very High-Voltage IC's
3个月前
已完结
A 500V 1A 1-Chip Inverter IC with a New Electric Field Reduction Structure
3个月前
已完结
Structure of 600 V IC and a new voltage sensing device
3个月前
已完结
A new level-shifting technique by divided RESURF structure
3个月前
已完结
Realization of robust 600V high side gate drive IC with a new isolated self-shielding structure
3个月前
已完结
Mechanism and Reliability Index of Hot-Carrier Degradation in LDMOS Transistors
3个月前
已完结
Hot-electron-induced degradation in high-voltage submicron DMOS transistors
3个月前
已完结
A new adaptive resurf concept for 20 V LDMOS without breakdown voltage degradation at high current
3个月前
已完结
Control of hot carrier degradation in LDMOS devices by a dummy gate field plate: experimental demonstration
3个月前
已完结
没有进行任何应助
已经找到【积分已退回】
3年前
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