Lv3
230 积分 2025-05-16 加入
Demonstration of Robust Breakdown Reliability and Enhanced Endurance in Gallium Doped HfO2 Ferroelectric Thin Films
16小时前
已完结
Domain Switching Characteristics in Ga-Doped HfO2 Ferroelectric Thin Films with Low Coercive Field
5天前
已完结
Oxygen vacancy control as a strategy to achieve highly reliable hafnia ferroelectrics using oxide electrode
12天前
已完结
Oxygen Vacancies Control Transition of Resistive Switching Mode in Single-Crystal TiO2 Memory Device
13天前
已完结
On the wrong assignment of the XPS O1s signal at 531–532 eV attributed to oxygen vacancies in photo- and electro-catalysts for water splitting and other materials applications
13天前
已完结
Study of the impact of interface traps associated with SiN X passivation on AlGaN/GaN MIS-HEMTs
15天前
已完结
Unintended Soft Breakdown Mechanism Limiting Ultrathin Ferroelectric HZO Films Scaling
1个月前
已完结
Effect of Thermal Annealing on the Structural and Electrical Properties of Hafnium Oxide Films
1个月前
已完结
Complex Internal Bias Fields in Ferroelectric Hafnium Oxide
1个月前
已完结
Effects of Polarization Behavior on Wake‐Up and Fatigue of Hafnium‐Based Ferroelectric Thin Films
2个月前
已完结
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