Lv11
60 积分 2025-09-23 加入
Effect of tungsten electrode crystallographic phases on the properties of HZO ferroelectric capacitor
1小时前
已完结
Interfacial Layer Engineering in Sub-5-nm HZO: Enabling Low-Temperature Process, Low-Voltage Operation, and High Robustness
5天前
已完结
Enhanced Ferroelectricity Achieved in Sub-6-nm Hf 0.5 Zr 0.5 O 2 Films by Using WO x Inserted W Electrodes
11天前
已完结
Ferroelectric Enhancement in a TiN/Hf1–xZrxO2/W Device with Controlled Oxidation of the Bottom Electrode
14天前
已完结
Fabrication and Characterization of Ferroelectric Capacitors with a Symmetric Hybrid TiN/W/HZO/W/TiN Electrode Structure
14天前
已完结
Understanding HZO Thickness Scaling in Si FeFETs: Low Operating Voltage, Fast Wake-Up, and Suppressed Charge Trapping
22天前
已完结
Tunable coercive voltage and polarization of HZO through field-induced phase transitions
22天前
已完结
Pulse‐Width‐Dependent Imprint Effect in Ferroelectric Hf 0.5 Zr 0.5 O 2 Capacitors
22天前
已完结
Ultrathin WO interfacial layer improving the ferroelectricity and endurance of Hf0.5Zr0.5O2 thin films on polyimide
1个月前
已完结
Experimental Investigation of Variations in Polycrystalline Hf 0.5 Zr 0.5 O 2 (HZO)-Based MFIM
1个月前
已完结
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