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BDSD-Net: An Efficient and High-Precision Anomaly Detector for Real-Time Semiconductor Wafer Vision Inspection
6天前
已完结
FALCO-WAFER: Feature-Aware Lightweight Contextual Detector for Wafer Defect Detection
6天前
已完结
Segmentation-Enhanced Overlapped Defect Identification for Multipatterns Wafer Maps
22天前
已完结
Deploying Edge LLMs for Wafer Defect Detection in Chip Manufacturing
22天前
已完结
Intelligent AI-Agents in Education: a Brief Overview of Concepts
22天前
已完结
Double Feature Extraction Method for Wafer Map Classification Based on Convolution Neural Network
1个月前
已完结
Wafer map failure pattern recognition based on deep convolutional neural network
1个月前
已关闭
Adaptive Frequency Filters As Efficient Global Token Mixers
1个月前
已完结
Grad-CAM: Visual Explanations from Deep Networks via Gradient-Based Localization
1个月前
已完结
Advanced Techniques in Semiconductor Defect Detection and Classification: Overview of Current Technologies and Future Trends in AI/ML Integration
1个月前
已完结
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