Lv1
100 积分 2022-07-23 加入
Dielectric failure mechanisms in advanced Cu/low-k interconnect architecture
5小时前
已完结
Reliability of gate dielectrics and metal–insulator–metal capacitors
2个月前
已完结
Technique of Control of the Gate Dielectric of MIS Structures Based on High-Field Charge Injection
2个月前
已完结
Polarity Dependence on Electrical Properties of Low-k Dielectric in Copper Interconnect Structures
3个月前
已完结
Comprehensive physics-based breakdown model for reliability assessment of oxides with thickness ranging from 1 nm up to 12 nm
3个月前
已完结
A model for silicon-oxide breakdown under high field and current stress
3个月前
已完结
Degradation of metal/oxide/semiconductor structures by Fowler-Nordheim tunnelling injection
3个月前
已完结
Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits
3个月前
已完结
Reliability Characteristics of Diamond-Like Carbon as Gate Insulator for Metal–Insulator–Semiconductor Application
5个月前
已关闭
A function-fit model for the soft breakdown failure mode
5个月前
已完结
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