Lv1
60 积分 2022-07-23 加入
Early Detection of Random High-k Dielectric Failure using Laser-Induced Leakage-Current Mapping
2天前
已完结
A Unified TDDB Model for BEOL Dielectrics of Various Structures and Thick FEOL Dielectrics
2天前
已完结
Enhanced TDDB-Reliability of Ultra-Thin Zirconia Capacitors Featuring Al-Doped Oxide Layers
2天前
已完结
Critical parameters of high performance metal-insulator-metal nanocapacitors: A review
3天前
已完结
High-k Metal–Insulator–Metal Capacitors for RF and Mixed-Signal VLSI Circuits: Challenges and Opportunities
7天前
已完结
Accounting for the Porosity of the Material in the Simulation of the Time-Dependent Dielectric Breakdown in the Metallization System of Integrated Circuits
9天前
已完结
Characterization and modeling of Al/sub 2/O/sub 3/ MIM capacitors: temperature and electrical field effects
12天前
已完结
Reliability acceleration model of stacked ZrO<inf>2</inf>-Al<inf>2</inf>O<inf>3</inf>-ZrO<inf>2</inf> MIM capacitor with cylinder type
12天前
已完结
Dielectric layers suitable for high voltage integrated trench capacitors
12天前
已完结
Physical model for the frequency dependence of time-dependent dielectric breakdown (TDDB)
13天前
已关闭
皖公网安备34019202002308
