| 标题 |
Main properties of Al2O3 thin films deposited by magnetron sputtering of an Al2O3 ceramic target at different radio-frequency power and argon pressure and their passivation effect on p-type c-Si wafers |
| 网址 | |
| DOI |
10.1016/j.tsf.2016.10.049
doi
|
| 其它 |
期刊:Thin Solid Films 作者:J.A. García-Valenzuela; R. Rivera; A.B. Morales-Vilches; L.G. Gerling; A. Caballero; et al 出版日期:2016 |
| 求助人 | |
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(2025-6-4)