| 标题 |
Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Instrumentation and Measurement 作者:Junho Kang; Woosol Han; Suhwan Kim; Jaehoon Jun 出版日期:2025 |
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(2025-6-4)