| 标题 |
A new method to measure spectral reflectance and film thickness using a modified chromatic confocal sensor |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optics and Lasers in Engineering 作者:Jiao Bai; Jingwen Li; Xiaohao Wang; Qian Zhou; Kai Ni; Xinghui Li 出版日期:2022-03-07 |
| 求助人 | |
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(2025-6-4)