| 标题 |
Revealing electrical and mechanical degradation of Ni/Bi2Te3 interface through the quantitative interfacial diffusion analysis |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Today Physics 作者:Tian Qiu; Zhi Li; Jie Zhou; Man Zhou; Shucheng Bao; et al 出版日期:2025-06-11 |
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(2025-6-4)