| 标题 |
Beyond a single mechanism: Uncovering the dual origin of degradation in β -Ga2O3 SBDs under forward bias stress |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Yingzhe Wang; Xuefeng Zheng; Sijie Bu; Tan Wang; Kang Li; et al 出版日期:2026 |
| 求助人 | |
| 下载 |
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(2025-6-4)