材料科学
光电子学
硅
深反应离子刻蚀
电镀
微电子机械系统
薄脆饼
共金键结
中间层
蚀刻(微加工)
模具(集成电路)
共晶体系
复合材料
合金
反应离子刻蚀
纳米技术
图层(电子)
作者
Hirofumi Chiba,Yukio Suzuki,Yoshiaki Yasuda,Mitsuyasu Kumagai,Takaaki Koyama,Shuji Tanaka
摘要
Abstract This paper reports a deep‐ultraviolet LED (deep‐UV‐LED) package based on silicon MEMS process technology (Si‐PKG). The package consists of a cavity formed by silicon crystalline anisotropic etching, through‐silicon vias (TSVs) filled with electroplated Cu, bonding metals made of electroplated Ni/AuSn and a quartz lid for hermetic sealing. A deep‐UV LED die is directly mounted in the Si‐PKG by AuSn eutectic bonding without a submount. It has advantages in terms of size, heat dissipation, light utilization efficiency, productivity and cost over conventional AlN ceramic packages. We confirmed a light output of 30 mW and effective reflection on Si (111) cavity slopes in the Si‐PKG. Based on simulation, further improvement of the optical output is expected by optimizing DUV‐LED die mount condition.
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