探测器
地图集(解剖学)
通量
物理
辐射损伤
大型强子对撞机
泄漏(经济)
像素
辐射
地图集实验
光学
核物理学
辐照
古生物学
经济
宏观经济学
生物
作者
G. Aad,B. Abbott,D. C. Abbott,A. Abed Abud,K. Abeling,D. K. Abhayasinghe,S. H. Abidi,O. S. AbouZeid,N. L. Abraham,H. Abramowicz,H. Abreu,Y. Abulaiti,A. C. Abusleme Hoffman,B. S. Acharya,B. Achkar,L. Adámek,C. Adam Bourdarios,L. Adamczyk,L. Adámek,J. Adelman
标识
DOI:10.1088/1748-0221/16/08/p08025
摘要
Abstract Non-ionizing energy loss causes bulk damage to the silicon sensors of the ATLAS pixel and strip detectors. This damage has important implications for data-taking operations, charged-particle track reconstruction, detector simulations, and physics analysis. This paper presents simulations and measurements of the leakage current in the ATLAS pixel detector and semiconductor tracker as a function of location in the detector and time, using data collected in Run 1 (2010–2012) and Run 2 (2015–2018) of the Large Hadron Collider. The extracted fluence shows a much stronger | z |-dependence in the innermost layers than is seen in simulation. Furthermore, the overall fluence on the second innermost layer is significantly higher than in simulation, with better agreement in layers at higher radii. These measurements are important for validating the simulation models and can be used in part to justify safety factors for future detector designs and interventions.
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