Review on accelerated life testing plan to develop predictive reliability models for electronic components based on design‐of‐experiments

Abstract Accelerated testing has been commonly used for the assessment of reliability of products or systems. In particular, it has been used to produce models for predicting the reliability of electronic components as a function of design and environmental parameters, or to qualify reliability. Extensive literature exists on different aspects ranging from defining type of stresses and type of censoring data, to optimizing test plans for efficient and relevant testing. On the other hand, design of experiments methodology is commonly used for studying the robustness of systems and for quality applications. This being said, combining both approaches, taking into account the system's physics of failure, is scarcely put into practice in a context of reliability prediction. Yet, this could significantly improve reliability prediction, especially in the case of electronic components which constantly go through technological progress with new parameters or properties to consider. After first presenting existing predictive reliability guides, models and parameters related to accelerated life testing, the purpose of this article is to provide a review of what has been done concerning the combination of such approaches.