材料科学
纳米尺度
分辨率(逻辑)
显微镜
方位角
图像分辨率
光学
纳米复合材料
超分辨率
纳米技术
图像(数学)
物理
计算机科学
人工智能
作者
Hajun Yoo,Hongki Lee,Woo Joong Rhee,Gwiyeong Moon,Chang‐Hun Lee,Seung Ah Lee,Jeon‐Soo Shin,Donghyun Kim
标识
DOI:10.1002/adom.202100211
摘要
Abstract Nanospeckle illumination microscopy (NanoSIM) based on disordered metallic nanocomposite island substrates is described. The nanoisland substrates can be fabricated without lithographic techniques. Azimuthal scanning illumination of nanoislands creates near‐field distribution that excites an arbitrary number of basis images to produce super‐resolution. Experimental studies of point‐spread images using NanoSIM with 360 basis images obtained by azimuthal scanning find spatial resolution improved by more than three times with an achievable full‐width‐at‐half‐maximum at 81.1 nm on average. The approach is confirmed by imaging aggregated nanobeads and nanoscale distribution of gangliosides on the HeLa cell membrane.
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