布里渊区
角分辨光电子能谱
半金属
光电发射光谱学
拓扑(电路)
电子结构
直线(几何图形)
费米面
物理
相(物质)
凝聚态物理
费米能级
钻石
几何相位
材料科学
X射线光电子能谱
电子
几何学
带隙
量子力学
核磁共振
数学
组合数学
超导电性
复合材料
作者
M. Mofazzel Hosen,Klauss Dimitri,Ilya Belopolski,Pablo Maldonado,R. Sankar,Nagendra Dhakal,Gyanendra Dhakal,Taiason Cole,Peter M. Oppeneer,D. Kaczorowski,F. C. Chou,M. Zahid Hasan,Tomasz Durakiewicz,Madhab Neupane
出处
期刊:Physical review
[American Physical Society]
日期:2017-04-03
卷期号:95 (16)
被引量:147
标识
DOI:10.1103/physrevb.95.161101
摘要
The discovery of a topological nodal-line (TNL) semimetal phase in ZrSiS has invigorated the study of other members of this family. Here, we present a comparative electronic structure study of ZrSiX (where X = S, Se, Te) using angle-resolved photoemission spectroscopy (ARPES) and first-principles calculations. Our ARPES studies show that the overall electronic structure of ZrSiX materials comprises of the diamond-shaped Fermi pocket, the nearly elliptical-shaped Fermi pocket, and a small electron pocket encircling the zone center ($\Gamma$) point, the M point, and the X point of the Brillouin zone, respectively. We also observe a small Fermi surface pocket along the M-$\Gamma$-M direction in ZrSiTe, which is absent in both ZrSiS and ZrSiSe. Furthermore, our theoretical studies show a transition from nodal-line to nodeless gapped phase by tuning the chalcogenide from S to Te in these material systems. Our findings provide direct evidence for the tunability of the TNL phase in ZrSiX material systems by adjusting the spin-orbit coupling (SOC) strength via the X anion.
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