单斜晶系
锡
薄膜
碘化物
材料科学
六方晶系
结晶学
衍射
格子(音乐)
晶体结构
X射线晶体学
化学
无机化学
纳米技术
光学
冶金
物理
声学
作者
V. S. Kostko,O.V. Kostko,Г. И. Маковецкий,K. I. Yanushkevich
标识
DOI:10.1002/1521-3951(200202)229:3<1349::aid-pssb1349>3.0.co;2-r
摘要
Thin films of tin(II) iodide were prepared and characterized. The lattice structure of thin films determined by X-ray diffraction is different from that of bulk SnI2. This change of lattice is explained by a polymorphous transition of monoclinic α-SnI2 to hexagonal β-SnI2. The unit cell parameters of β-SnI2 are a = (4.506 ± 0.014) Å, c = (6.946 ± 0.011) Å. Thin films of β-SnI2 have predominant [001] orientation.
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