石墨烯
材料科学
X射线光电子能谱
拉曼光谱
剥脱关节
化学工程
异质结
蚀刻(微加工)
纳米技术
图层(电子)
光电子学
光学
物理
工程类
作者
Carlos Macías,A. Cavanna,Ali Madouri,Solène Béchu,Stéphane Collin,Jean‐Christophe Harmand,Andréa Cattoni,Amaury Delamarre
标识
DOI:10.1016/j.apsusc.2024.160913
摘要
Large surface transfer is a long-standing challenge for applications that require stacking 2D and 3D materials with only a limited number of combinations and techniques currently found in the literature. We report a systematic study of CVD graphene transfer to GaAs surfaces by mechanical exfoliation from Ge(1 1 0) substrates using highly stressed Ni layers. A uniform contact at the 2D-3D interface, achieved by aircushion pressing, enables a high yield of the transfer process to GaAs and other substrates exceeding 95% of the initial surface over cm-scales. Raman spectroscopy verifies that the crystalline quality of the transferred graphene is similar to that of the as-grown graphene, with its initially high compressive strain partially relaxed and no unintentional doping. After a two-step selective etching of the Ni layer in H2SO4: Sodium-n nitrobenzene sulfonate: thiourea (Transene etchant TFG) and HCl, we studied the surface chemistry of the resulting graphene/GaAs surfaces by X-ray photoelectron spectroscopy (XPS). Undoped GaAs remains unoxidized during the transfer process with an increase of the As-As related peaks due to preferential Ga dissolution during the acid-based deoxidation and etching processes, whereas p-type GaAs in contact with graphene showed corrosion damage attributed to a galvanic process with graphene acting as the cathode. This work provides new insights on the potential and processing constraints of dry-transferred graphene/GaAs heterostructures.
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