离域电子
电荷(物理)
覆盖层
Atom(片上系统)
材料科学
密度泛函理论
离子键合
原子物理学
结晶学
物理
化学
凝聚态物理
离子
量子力学
计算机科学
嵌入式系统
作者
Conor Hogan,D. Paget,Y. Garreau,M. Sauvage,Giovanni Onida,Lucia Reining,P. Chiaradia,V. Corradini
出处
期刊:Physical review
日期:2003-11-19
卷期号:68 (20)
被引量:72
标识
DOI:10.1103/physrevb.68.205313
摘要
We investigate the adsorption of Cs on the As-rich $c(2\ifmmode\times\else\texttimes\fi{}8)/(2\ifmmode\times\else\texttimes\fi{}4)$ reconstruction of GaAs(001) at low coverages using a combination of theoretical and experimental techniques. Density-functional-theory local-density-approximation total-energy calculations and x-ray diffraction experiments find only minimal Cs-induced surface relaxation and identify three preferential adsorption sites within the partially disordered overlayer. These sites are, in order of decreasing occupation probability, the arsenic dimer bridge D site, the gallium dangling bond ${T}_{2}^{\ensuremath{'}}$ site, and the arsenic ${T}_{3}$ trench site. Detailed analysis of the wave functions and electronic charge densities allows us to clarify the bonding mechanisms at the three sites. At the gallium site, the bonding is strongly ionic and involves significant charge transfer to a new Cs-induced state reminiscent of the ${p}_{z}$ orbital of the gallium atom in the ${\mathrm{sp}}^{{}_{2}}$ configuration. In sharp contrast, at the arsenic sites, the charge transfer is minimal and the bonding rather occurs through mixing with a relatively delocalized state of the clean surface. The ionization energy decreases are estimated and compared for the three sites.
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