材料科学
电阻随机存取存储器
电铸
纳米片
可靠性(半导体)
光电子学
记忆电阻器
纳米技术
金属有机骨架
电压
图层(电子)
电子工程
功率(物理)
电气工程
化学
工程类
吸附
物理
有机化学
量子力学
作者
Guanglong Ding,Yaxin Wang,Guixian Zhang,Kui Zhou,Kelin Zeng,Zongxiao Li,Ye Zhou,Chen Zhang,Xiaoli Chen,Su‐Ting Han
标识
DOI:10.1002/adfm.201806637
摘要
Abstract Metal–organic framework (MOF) nanosheets have attracted significant interests for sensing, electrochemical, and catalytic applications. Most significantly, 2D MOF with highly accessible sites on the surface is expected to be applicable in data storage. Here, the memory device is first demonstrated by employing M‐TCPP (TCPP: tetrakis(4‐carboxyphenyl)porphyrin, M: metal) as resistive switching (RS) layer. The as‐fabricated resistive random access memory (RRAM) devices exhibit a typical electroforming free bipolar switching characteristic with on/off ratio of 10 3 , superior retention, and reliability performance. Furthermore, the time‐dependent RS behaviors under constant voltage stress of 2D M‐TCPP–based RRAMs are systematically investigated. The properties of the percolated conducting paths are revealed by the Weibull distribution by collecting the measured turn‐on time. The multilevel information storage state can be gotten by setting a series of compliance current. The charge trapping assisted hopping is proposed as operation principle of the MOF‐based RRAMs which is further confirmed by atomic force microscopy at electrical modes. The research is highly relevant for practical operation of 2D MOF nanosheet–based RRAM, since the time widths, magnitudes of pulses, and multilevel‐data storage can be potentially set.
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