响应度
光电子学
材料科学
紫外线
雪崩光电二极管
光电二极管
量子效率
硅
钙钛矿(结构)
量子点
二极管
光学
光电探测器
化学
探测器
物理
结晶学
作者
T. Liu,X. Liu,D. Chen,Q. Liu,Yong Zuo,Xin Guo,Junrong Zheng,Z. liu,Chunlai Xue,Bingying Cheng
摘要
Since the absorption zone of ultraviolet (UV) photons with high energy is limited to a few tens of nm on the surface, the high defect density caused by the processes, such as ion implantation, leads to a weak response of the silicon avalanche photodiode (APD) in the ultraviolet band. In this work, the integration of the inorganic perovskite quantum dots (QDs) film by drop-casting as the down-shifting layer is reported for enhancing the UV response of Si APD. The light generated current increases 100% under the 365 nm light emitting diode. The response of the Si APD is improved in the entire ultraviolet band. In particular, the responsivity of APD is increased by 78% at 340 nm with an exceedingly EQE of 92%. In summary, the perovskite QDs film as a down-shifting layer provides an effective and low-cost method to improve the UV response of Si APD.
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