曲面(拓扑)
空格(标点符号)
传递矩阵法(光学)
基质(化学分析)
材料科学
传递矩阵
计算机科学
光电子学
数学
几何学
复合材料
计算机视觉
操作系统
作者
Zijian Chen,Yanhua Zhong,Zenghong Ma,Si Meng
标识
DOI:10.35848/1347-4065/ad26d0
摘要
Abstract The antireflection coating (ARC) can improve the photoelectric conversion efficiency of photovoltaic (PV) cells. In this paper, the influence of film thickness and refractive index of single-layer and double-layer ARC on solar light absorption under different spectral conditions is simulated by the transfer matrix method. The optimum values of ARC film thickness and refractive index are obtained. To optimize it at AM 0 (air mass 0) solar irradiance, a 66 nm thick SiN x ARC with a refractive index of 2.0 was used. The PV cell’s maximum power density is 89.87. The maximum power density of the PV cell with double-layer SiN x as ARC is 90.94. This work provides a theoretical basis for the application of ARC in ground PV power generation systems and space solar power systems.
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